Condition

S-parameter Measurement of Multilayer Ceramic Capacitors
S-parameter library provides the S-parameter data which could be used in circuit designs.
Below are the details of the procedure for measuring S-parameter data, the applied land pattern, the measurement equipment, and the measurement conditions for capacitors.


- Measurement Procedure -

The measurement procedure is indicated below. The S-parameter data is measured with two ports by a Network analyzer and the other equipment.

1. Correction

Two kinds of correction, SOLT (partly SOL) and TRL, are used. SOLT applies Murata's original land pattern (Short, Open, Load, and Thru) to the lower frequency area.
Meanwhile, TRL uses Murata's original land pattern (Thru, Reflect, Line, Match) for the higher frequency range.

2. Extraction of S-parameter data for the capacitor alone

After soldering the capacitor to the land pattern, we fix it to a measurement jig connected to a network analyzer,/impedance analyzer, and measure it.

3. Extraction of S-parameter data for the capacitor alone

In the S-parameter data, although the characteristics of the land pattern and measurement equipment are eliminated by correction and electrical delay, the characteristics of the via holes and the land pattern are still included in the measurement. Therefore, the data of the capacitor itself is extracted by eliminating the characteristics of the via holes and the land pattern.

Fig.1 Measurement of S parameter data
Fig.1 Measurement of S-parameter data


- Land pattern -

The following shows the land patterns which are used in the measurements.
Fig.2 shows the structure of the land pattern.

Item max8.5GHz max20GHz
Sub strate material Glass epoxy resin Glass fluorine resin
Thickness of layer 100µm 160µm
Sub strate structure Microstrip Coplanar
Instrinsic impedance 17Ω 50Ω
Pattern material Copper foil
+ Gold coating
Copper foil
+ Gold coating

Fig.2 Structure of Land Pattern

LW Dimension Land Pattern [mm]
JIS [mm] EIA [inch] a b C
0402 01005 0.2 0.18 0.23
0603 0201 0.3 0.35 0.40
1005 0402 0.5 0.45 0.60
1608 0603 0.8 0.7 0.8
2012 0805 1.2 0.7 1.1
2828 1111 2.1 0.9 2.6
3216 1206 2.4 0.9 1.4
3225 1210 2.4 0.9 2.3
4532 1812 3.5 1.4 3.0
4520 1808 3.5 1.4 1.8
5750 2220 4.6 1.6 4.8
0510 0204 0.2 0.3 1.0
0816 0306 0.3 0.4 1.6
1220 0508 0.6 0.5 1.8
1632 0612 0.8 0.7 2.8
2040 0816 0.9 0.8 4.0
Fig.2 Structure of Land Pattern


- Measurement Equipment -

Listed below is the equipment used in the measurements.

Temperature compensating type capacitor*For a capacitor of 1,000pF or more, the same conditions as those used for a high dielectric constant type capacitor are used.

  • Network Analyzer: E5071C/N5225A (Keysight Technologies)
  • Impedance analyzer: E4991A (Keysight Technologies)
  • Measurement jig: PC-SMA/PC-V (YOKOWO)

High dielectric constant type capacitor

  • Network Analyzer: E5061B/E5071C (Keysight Technologies)
  • Measurement jig: PC-SMA (YOKOWO)

- Measurement Condition -

In the measurements, the frequency is classified into a higher range and a lower range.
The proper conditions are applied to each frequency. Table 1 shows the measurement conditions for a temperature compensating type capacitor, and Table 2 shows the measurement conditions for a high dielectric constant type capacitor.

Table 1 Measurement conditions for a temperature compensating type capacitor
Types of freq. Lower Freq. Higher Freq. 1 Higher Freq. 2
Network Analyzer/
Impedance Analyzer
E4991A
Keysight Technologies
E5071C
Keysight Technologies
N5225A
Keysight Technologies
Range of freq. 100MHz to 3GHz 100MHz to 8.5GHz 500MHz to 20GHz
Correction Kit SOLT
(+low-loss capacitor)
TRL
Connection Mode 1 port 2 port shunt mode
*For a capacitor of 1,000pF or more, the same conditions as those used for a high

Table 2 Measurement conditions for a high dielectric constant type capacitor
Types of freq. Lower Freq. Higher Freq.
Network Analyzer E5061B
Keysight Technologies
E5071C
Keysight Technologies
Range of freq. 100Hz to 100KHz 100kHz to 6GHz
Correction Kit SOLT TRL
Connection Mode 2 port shunt mode