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S Parameter

Outline of S Parameter Measurement

S parameter library provides the S parameter data which could be used in circuit designs.
Below are the details of the procedure for measuring S parameter data, the applied land pattern, the measurement equipment, and the measurement conditions for capacitors.

Measurement Procedure

The measurement procedure is indicated below. The S parameter data is measured with two ports by a Network analyzer and the other equipment.

1. Correction

SOLT and TRL are applied as corrections. SOLT applies Murata’s original land pattern (Short, Open, Load, and Thru) to the lower frequency area.
Meanwhile, TRL uses Murata’s original land pattern (Thru, Reflect, Line, Match) for the higher frequency range.

2. Extraction of S parameter data for the capacitor alone

After soldering the capacitor on the land pattern, we measure it by connecting the equipment with the network analyzer.

3. Extraction of S parameter data for the capacitor alone

In the S parameter data, although the characteristics of the land pattern and measurement equipment are eliminated by correction and electrical delay, the characteristics of the via holes are still included in the measurement . Therefore, the data of the capacitor itself is extracted by eliminating the characteristics of the via holes.

Fig.1 Measurement of S parameter data

Fig.1 Measurement of S parameter data

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Land pattern

The following shows the land patterns which are used in the measurements.
Fig.2 shows the structure of the land pattern.

Fig.2 Structure of Land Pattern

Fig.2 Structure of Land Pattern

Material Glass Epoxy Resin (layer thickness:0.1mm)
Land Pattern Material Copper foil (thickness: 0.035mm), Au plating (thickness: 0.003mm)
Microstrip Line Length:10mm, Width0.9mm
Impedance 20Ω
Dimension of land pattern See Fig.3
Fig.3 Dimension of Land Pattern

Fig.3 Dimension of Land Pattern

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Measurement Equipment

Listed below is the equipment used in the measurements.

Network Analyzer E5061B/E5071C (Agilent Technologies)
Measurement jig PC-SMA (YOKOWO)

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Measurement Condition

In the measurements, the frequency is classified into a higher range and a lower range.
The proper conditions are applied to each frequency. Fig.1 shows these conditions.

Fig.1 Measurement Conditions

Types of freq. Lower Freq. Higher Freq.
Network Analyzer E5061B Agilent Technologies E5071C Agilent Technologies
Range of freq. 100Hz~10MHz 100kHz~8.5GHz
Correction Kit SOLT TRL
Connection Mode Shunt mode

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