Polymer Aluminum Electrolytic Capacitors Failures and Life

Polymer Al Capacitor

Main failure modes

The main failure mode of the ECAS series is open mode due to aging (1).
We carry out sufficient debugging and screening in our process. Therefore, basically, the probability of a failure occurring is low and the characteristics are stable. Nevertheless, the possibility of a failure occurring is not zero. In addition, there is a possibility of short mode occurring under harsh conditions such as when a load exceeds the allowable limit is applied (2).

  • (1) Wear-out failure: Open mode due to a decline in the capacitance

    The electrolyte (polymer) degrades under a high-temperature environment with the result that the capacitance deviates from the standard value. That eventually leads to open mode. This corresponds to the end of the life of the ECAS series. The ECAS series uses a conductive polymer. Therefore, it features a longer life than conventional electrolyte-type electrolytic capacitors that can experience dry-up failures. The ECAS series has a track record of problem-free use by many customers since its commercialization in 2000.

  • (2) Accidental failure: Short mode due to increased leakage current

    In rare cases, when a load (thermal stress, electrical stress, or mechanical stress) exceeding the allowable limit is suddenly applied in the circuit, a dielectric breakdown of the dielectric oxide film may occur, leading to short mode.

Failure Mode in Market

Failure Mode in Market is Open mode mainly.

Estimated life of wear-out failure

Polymer aluminum electrolytic capacitors slowly degrade due to the usage conditions such as the ambient temperature and humidity.
Specifically, deterioration appears as a decrease in capacitance and an increase in ESR due to the electrochemical reaction of aluminum oxide (dielectric), which is an internal component, and organic components such as conductive polymers and carbon paste.

Figure 1. Change due to aging degradation of capacitance and ESR

The decrease in capacitance and the increase in ESR due to aging are caused by the decrease in the active area of the electrode and the decrease in the contact area between layers due to the products generated by the electrochemical reaction, as shown in the figure below.

Figure 2. Relationship between time and active surface reduction (model)

In this way, if we define the state in which the ESR or capacitance has degraded by a certain amount as the end of the life of the capacitor, we can also estimate the time until that life ends.
The temperature dependence is based on reaction kinetics, that is, the Arrhenius model. The voltage dependence is based on the Eyring model, which is an extension of the Arrhenius model.

Murata provides an original estimated life calculation tool based on this reliability logic.
This simulation makes it possible to predict the degree of capacitance/ESR degradation under the actual usage environment. That can then be applied to the design.

You will need to register as a member of "my Murata" to use the estimated life calculation simulation.

"my Murata" is a registration-based portal site for engineers. If you register with "my Murata," in addition to the estimated life calculation simulation, you can apply for technical notes and free samples and obtain information necessary for design such as contents relating to the certification of external drawings and other documents.