TVS Diodes (ESD Protection Devices)Section 2 “What are ESD Tests?”

ESD Test Standard

Manufacturers of electronic devices are required to devise appropriate ESD countermeasures that satisfy the standards of each electronic device, and various tests and standards have been enacted for each purpose and product. There are three representative methods of testing various devices such as IC circuits and electronic components: HBM (Human Body Model), MM (Machine Model), and CDM (Charged Device Model). Each of these tests is carried out according to the following standards, on the applicable components and devices, under the applicable test conditions.

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Test method Standard Applicable components General test conditions Phenomenon model
HBM
(Body model)
JEDEC JESD22-A114 Electronic components
(For civilian use)
Capacitor: 100 pF, internal resistance: 1.5 kΩ
Applied voltage: 1/2/4/8 kV
Test model for the case where a charge accumulated on the human body causes ESD
MM
(Machine model)
JEDEC JESD22-A115 Electronic components
(For manufactured devices)
Capacitor: 200 pF, Internal resistance: 0 Ω
Applied voltage: 100/200/400 V
Test model for the case where a charge accumulated on metal such as equipment or jigs and tools causes ESD
CDM
(Charged device model)
JEDEC JESD22-C101 Electronic components
(For manufactured devices)
The capacitor and internal resistance differ according to the test device:500/1000 V Test model for the case where a charge accumulated on the device itself cause ESD

TVS Diode ESD Test

Tests on TVS Diodes are covered by standard IEC61000-4-2. Murata evaluates its products using the method stipulated by this standard. For the test, the following circuit which includes a 150 pF capacitor and an internal resistance of 330 Ω is used, and the resistance of the product to breakdown is evaluated by discharging four ESD voltages in the sequence 2 kV, 4 kV, 6 kV, and 8 kV, to the case of the device. Since the testing equipment enables testing of up to 30 kV, tests of over 8 kV can also be performed.

IEC610000-4-2 test circuit