Multilayer Ceramic Capacitors - S-parameter Measurement Conditions | Multilayer Ceramic Capacitors(MLCC)

S-parameter library provides the S-parameter data which could be used in circuit designs.
Below are the details of the procedure for measuring S-parameter data, the applied land pattern, the measurement equipment, and the measurement conditions for capacitors.

Measurement Procedure

The measurement procedure is indicated below. The S-parameter data is measured with two ports by a Network analyzer and the other equipment.

1Calibration

Two kinds of calibration, SOLT (partly SOL) and TRL, are used. SOLT applies Murata's original land pattern (Short, Open, Load, and Thru) to the lower frequency area. Meanwhile, TRL uses Murata's original land pattern (Thru, Reflect, Line, Match) for the higher frequency range.
2Measurement

After soldering the capacitor to the land pattern, we fix it to a measurement jig connected to a network analyzer,/impedance analyzer, and measure it.
3Extraction of S-parameter data for the capacitor alone

In the S-parameter data, although the characteristics of the land pattern and measurement equipment are eliminated by calibration and electrical delay, the characteristics of the via holes and the land pattern are still included in the measurement. Therefore, the data of the capacitor itself is extracted by eliminating the characteristics of the via holes and the land pattern.
Fig.1 Measurement of S-parameter data

Land pattern

The following shows the land patterns which are used in the measurements. Fig.2 shows the structure of the land pattern.

Item	max8.5GHz	max20GHz
Sub strate material	Glass epoxy resin	Glass fluorine resin
Thickness of layer	100µm	160µm
Sub strate structure	Microstrip	Coplanar
Instrinsic impedance	17Ω	50Ω
Pattern material	Copper foil + Gold coating	Copper foil + Gold coating

Fig.2 Structure of Land Pattern
LW Dimension		Land Pattern [mm]
JIS [mm]	EIA [inch]	a	b	c
0402	01005	0.2	0.18	0.23
0603	0201	0.3	0.35	0.40
1005	0402	0.5	0.45	0.60
1608	0603	0.8	0.7	0.8
2012	0805	1.2	0.7	1.1
2828	1111	2.1	0.9	2.6
3216	1206	2.4	0.9	1.4
3225	1210	2.4	0.9	2.3
4532	1812	3.5	1.4	3.0
4520	1808	3.5	1.4	1.8
5750	2220	4.6	1.6	4.8
0510	0204	0.2	0.3	1.0
0816	0306	0.3	0.4	1.6
1220	0508	0.6	0.5	1.8
1632	0612	0.8	0.7	2.8
2040	0816	0.9	0.8	4.0

Measurement Equipment

Listed below is the equipment used in the measurements.

Temperature compensating type capacitor

*For a capacitor of 1,000pF or more, the same conditions as those used for a high dielectric constant type capacitor are used.

Network Analyzer: E5071C/N5225A (Keysight Technologies)
Impedance analyzer: E4991A (Keysight Technologies)
Measurement jig: PC-SMA/PC-V (YOKOWO)

High dielectric constant type capacitor

Network Analyzer: E5061B/E5071C (Keysight Technologies)
Measurement jig: PC-SMA (YOKOWO)

Measurement Condition

In the measurements, the frequency is classified into a higher range and a lower range.
The proper conditions are applied to each frequency. Table 1 shows the measurement conditions for a temperature compensating type capacitor, and Table 2 shows the measurement conditions for a high dielectric constant type capacitor.

Table 1 Measurement conditions for a temperature compensating type capacitor
Types of freq.	Lower Freq.	Higher Freq. 1	Higher Freq. 2
Network Analyzer/Impedance Analyzer	E4991A Keysight Technologies	E5071C Keysight Technologies	N5225A Keysight Technologies
Range of freq.	100MHz to 3GHz	100MHz to 8.5GHz	500MHz to 20GHz
Calibration Kit	SOLT校正(+low-loss capacitor)	TRL
Connection Mode	1 port	2 port shunt mode

*For a capacitor of 1,000pF or more, the same conditions as those used for a high

Table 2 Measurement conditions for a high dielectric constant type capacitor
Types of freq.	Lower Freq.	Higher Freq.
Network Analyzer	E5061B Keysight Technologies	E5071C Keysight Technologies
Range of freq.	100Hz to 100KHz	100kHz to 6GHz
Calibration Kit	SOLT	TRL
Connection Mode	2 port shunt mode