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 Sensor Noise Testing Method |
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This testing
method is used to measure the noise generated from the sensor. |
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<Testing
Circuit> |
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<Testing
Method> |
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| (1) |
Measure noise by using the measuring circuit with
an oscilloscope. The head surface must be free from magnetism. (Do not
place a magnetic object near the head surface.) |
| (2) |
The measuring range of the oscilloscope is 0.5
V/DIV or 50 ms/DIV. |
| (3) |
To prevent static electricity from the body from
affecting the measurement results, the person who conducts this test
should wear an earth band. |
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| Piezoelectric Noise Testing Method |
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Piezoelectric
noise is a voltage generated between both ends of an element (resistor)
when external stress is applied to the element (resistor). The element
is protected by a space between the element and case, so that external
forces will not affect the measurement results. |
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<Testing
Circuit> |
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The sensor noise
measuring circuit is used. |
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<Testing
Method> |
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| (1) |
A card is scanned with the sensor's detecting
surface, as shown below: |
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| (2) |
Apply 5 ±0.1 VDC to the sensor, and apply 98 mN
spring load to the transport roller. Through the sensor noise measuring
circuit (gain: x 10,000), measure the voltage generated when the card
is transported at a speed of 2 mm/s. |
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