TLP (Transmission Line Pulse) measurement is a test to acquire voltage (V)/impedance (I) characteristic data for ESD protection elements and ESD protection circuits by applying pulses to transistors and integrated circuits.
It confirms in which I-V characteristic how much current can be allowed on ESD protection elements and protected elements for pulse waves with short time constants such as ESD surges.
Thermal destruction may occur on DC but measurements on TLP devices prove that thermal destruction rarely occurs, enabling acquisition of characteristics with large currents.