In the ECAS series, aging deterioration (decrease in capacitance, increase in ESR) occurs due to the electrochemical reaction of aluminum oxide (dielectric), which is an internal component, and organic components such as conductive polymers and carbon paste.
The decrease in capacitance and the increase in ESR due to aging are caused by the decrease in the active area of the electrode and the decrease in the contact area between layers due to the products generated by the electrochemical reaction, as shown in the figure below.
ECAS series aging degradation (decrease in capacitance / increase in ESR) is a slow reaction over time due to the external environment and is predictable according to reaction kinetics.
The specific degree of deterioration is temperature-dependent or voltage-dependent. The temperature dependence is based on the reaction kinetics, that is, the Arrhenius model, and the voltage dependence is based on the Eyring model, which is an extension of the Arrhenius model.
Murata enabled the original degradation simulation based on this reliability logic.
By this deterioration simulation, it is possible to predict the degree of deterioration of capacitance / ESR under the actual usage environment and apply it in the design.
Please contact Murata for details.