Silicon CapacitorsThe lifetime of Murata silicon capacitor

Relationship between product lifetime and recommended voltage

The lifetime of Murata silicon capacitors is calculated by acceleration tests.
Using the Oxide Fracture (TDDB: Time Dependent Dielectric Breakdown) measurement, one of the fracture mode measurements of semiconductors, we model the fracture mode and estimate the product lifetime using the acceleration coefficients of temperature and electric field.
The recommended voltage with a product life of 10 years in a temperature environment of 100°C varies from technology to technology.
Please refer to the table below.

Murata's silicon capacitors
Breakdown Voltage (BV) Recommended Voltage Murata Technology
11V 3.6V PICS3
30V 16V PICS3HV
50V 21V PICSHV50
100V 32V PICSHV100
150V 68V PICSHV150
Example
If 32 V is continuously applied to a product of PICSHV100, the expected life is 10 years. (When the environmental temperature is 100°C)

Fracture mode in semiconductor

Figure of fracture mode in semiconductor

When a dielectric such as an oxide film  is used at a constant voltage and temperature, oxide breakdown is observed over time. This is called TDDB and is one of the important fracture modes in semiconductors.
This phenomenon is accelerated under high voltage or high temperature conditions.

Example of test results

Let's take one of Murata's technologies, PICS3HV (BV: 30 V).

Vg (V) 37°C 100°C 150°C 225°C
10 3076 years 671 years 276 years 102 years
13 377 years 82 years 33 years 12 years
16 46 years 10 years 4.1 years 1.5 years
19 5.6 years 1.2 years 186 days 69 days

As you can see from the table, if the rated voltage is 16V at 100°C, the lifetime of PICS3HV is more than 10 years.
In this way, the product lifetime of the Murata silicon capacitor is calculated by each temperature and voltage applied.

For details, see the following PDF document.

See below for FAQs on silicon capacitor.

Additional inquiries can be made through Contact Form.